A methodology is proposed to assess the metrological performances of the image processing algorithms that constitute their main component, the knowledge of which being required for a global assessment of the whole measurement system. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. These techniques have proven to be very useful in testing different materials in a non-destructive way. Author by : William T. Many other developments are also discussed. Several optical configurations suitable for in-field applications are presented.
This current volume is a report of the recent contributions of a group of us who have been working together in the metrology department of the Centro de Investigaciones en Optica in Mexico. Speckle techniques have the advantages cited for optical methods. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems. Sie benötigen eine und die Software kostenlos. In 2003 the Secretary of Science and Technology of Argentina awarded him the Bernardo Houssay Prize for his contributions to the field of optical engineering. Author by : Pramod K. These techniques have proven to be very useful in testing different materials in a non-destructive way.
However, these devices are not of universal use. Results show general trends rather independent of the implementations but strongly correlated with the assumptions of the underlying algorithms. Optical techniques are usually applied inside laboratories equipped with temperature, humidity and vibration control. The contacting mode of atomic force microscopes actually belongs to this mechanical category Bowen and Hilal, 2009. The most up-to-date picture of the field of speckle metrology today. Additionally, various environment agents are described, showing the effect that they have on the measuring performance of the optical system.
To be specific, they are the people listed below as members of the scientific and local committees. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. The chapter offers tools, tips, and reference parameters to guide the development and design of interferometers based on the speckle phenomenon for use outside of the laboratory. Kaufmann - show new branches in speckle metrology, new proposed schemes and improvements in processing techniques, and optical approaches that have occurred over the last 20 years. The numerical simulation results support that this paper provides a new method for in-plane displacement measurement. Consequently, a fast inspection procedure enables the evaluation of large areas e. A theoretical model to describe the generated speckle patterns is developed.
Author by : Guillermo H. The simulation results are compared and validated with those obtained using Fourier transform method in electronic speckle pattern interferometry experiment system. These techniques have proven to be very useful in testing different materials in a non-destructive way. Evaluated displacements are compared with the exact imposed values and errors are statistically analyzed. The use of cold atom techniques, slowed down and cooled, has opened a number of unexpected avenues for metrology and fundamental constants, one of these possibilities being the atom interferometry. In this case, a small hole is introduced into the material, allowing for local stress relief that enables stress measurements. After recognizing that each speckle has a definite phase, several techniques were developed to measure deformations, displacements, stresses, vibrations, and inner defects.
They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. Describes new techniques developed in the field of speckle metrology during the last decade, and its applications to experimental mechanics, material science, optical testing, and fringe analysis. After a short introduction, the principles for traditional strain-gage sensors are presented. Category: Science Author : Kjell J. Finally, principles for shearography are shown. Writing this preface in July, in anticipation of the conference, we have tried to envisage how this book will benefit the quality of discourse between authors and attendees. However, applying speckle methods outside of the laboratory becomes a challenging task.
Gary Schajer for his kind help and valuable collaboration with some figures obtained by residual stress measurements with the hole-drilling techniques; Prof. It will be present an optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers we call it in the rest of the presentation System A, for brevity. In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. Among them, optical methods based on the speckle phenomenon have developed substantially over the last two decades due to the development of digital image processing, digital cameras, computers, lasers, and optical components. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications.
It is well known that when an optically rough surface is illuminated by coherent light speckles can be observed and imaged on a detector. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends. . A set of speckle patterns is generated deterministically at radio-frequency rate, multiplied by the temporal signal and time integrated in a single shot by the camera. By unwrapping, we obtain the three-dimensional distribution of the in-plane displacement deformed phase. A method for simultaneously measuring whole field in-plane displacements by using optical fiber and Fast Fourier Transform Method is presented to transient or non-repeatable events.
This procedure is based on the construction of a particular multi-frequential field, and a Bode diagram representation of the results. This study is relevant both for identifying a convenient technique that provides good qualities of three-dimensional replicas and for selecting the hardware whose price is affordable even for small research groups studying rougher surface textures. Besides the mechanical tools, optical devices exist in diverse modifications Bennett and Mattson, '99 : light section microscopy Tolansky, '52; Thi ery and Green, 2012 , coherence scanning interferometry De Groot, 2015 , speckle metrology Kaufmann, 2011 , stereo projection Mettanen and Hirn, 2015 , photogrammetry Bertin et al. Author by : Guillermo H. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. The study is based on displacement error assessment from synthetic speckle images.
A full-field measurement can be characterized by its resolution, bias, measuring range, and by a specific quantity, the spatial resolution. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. The average speckle size is governed by an external slit pupil. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2. Kaufmann is professor of Applied Optics at the National University of Rosario, Argentina, and chief scientist at the Physics Institute of Rosario which is linked both to the university and to the National Council of Scientific and Technological Research. The application of digital techniques allows for automatic processing.